Phase dimensions resolving of efficient and stable perovskite light-emitting diodes at high brightness

Shuo Ding, Qiangqiang Wang, Wencui Gu, Zhaobing Tang, Bo Zhang, Chunyan Wu, Xuanyu Zhang, Hao Chen, Xinyu Zhang, Rui Cao, Tao Chen, Lei Qian, Chaoyu Xiang

Research output: Journal PublicationArticlepeer-review

2 Citations (Scopus)

Abstract

The efficiency and stability issues of perovskite light-emitting diodes, especially at high brightness, need to be urgently solved for displays and lighting applications. Herein we present a simple chemical washing method called solvent sieve to resolve the phase dimension issue of metal halide perovskites. After being sieved, undesirable defect-rich low-n phases are selectively screened out of perovskite multi-quantum-well structures. With better intrinsic structure refinement, the sieved perovskites demonstrated not only a record external quantum efficiency, current efficiency, and T50 lifetime of 29.5%, 127.4 cd A−1, and 18.67 h at 12,000 cd m2 (the equivalent of over 50,317 h or 5.7 years at 100 cd m2), respectively, with a maximum luminance of over 147,872.8 cd m2, but also extraordinary resistance to air and moisture, maintaining over 75% of film photoluminescence quantum yield and 80% of device EQE after being stored at ambience for 100 days. The simple solvent sieve treatment we reported here confirms the feasibility of metal halide perovskites for luminescence and unleashes the efficiency and stability potentials of high-brightness perovskite light-emitting diodes for future commercial applications.

Original languageEnglish
Pages (from-to)363-370
Number of pages8
JournalNature Photonics
Volume18
Issue number4
DOIs
Publication statusPublished - Apr 2024

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'Phase dimensions resolving of efficient and stable perovskite light-emitting diodes at high brightness'. Together they form a unique fingerprint.

Cite this