Optoelectronic, structural and morphological analysis of Cu₃BiS₃ sulfosalt thin films

Keyphrases

• Atomic Force Microscopy 40%
• Bi2S3 Thin Films 20%
• Bismuthinite 40%
• Charge Carrier Concentration 20%
• Chemical Bath Deposition 20%
• Cu3BiS3 100%
• Deposition Mechanism 20%
• Design Mechanism 20%
• Ellipsometry 20%
• Hall Effect 20%
• Hall Mobility 20%
• Mineral Species 20%
• Mineralogy 20%
• Morphological Analysis 100%
• Morphological Behavior 20%
• Optical Band Gap 20%
• Optoelectronic Analysis 100%
• Optoelectronic Behavior 20%
• Photovoltaic Applications 20%
• Resistivity 20%
• Room Temperature 20%
• Scanning Electron Microscopy 20%
• Structural Behavior 20%
• Sulfosalt 100%
• UV-VIS Spectroscopy 20%
• X Ray Diffraction 20%
• XRD Analysis 20%

Engineering

• Atomic Force Microscopy 20%
• Carrier Concentration 20%
• Charge Carrier 20%
• Deposition Mechanism 20%
• Design of Experiments 20%
• Optoelectronics 100%
• Photovoltaics 40%
• Ray Diffraction 20%
• Room Temperature 20%
• Synthesized Material 40%
• Thin Films 100%
• X-Ray Diffraction Analysis 20%

Material Science

• Carrier Concentration 20%
• Charge Carrier 20%
• Electrical Resistivity 20%
• Film 40%
• Hall Mobility 20%
• Morphology 100%
• Photovoltaics 40%
• Scanning Electron Microscopy 20%
• Thin Films 100%
• X-Ray Diffraction 40%