Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces

A. Bilbao-Guillerna, R. T. Eachambadi, G. B.J. Cadot, D. A. Axinte, J. Billingham, F. Stumpf, S. Beuer, M. Rommel

Research output: Journal PublicationArticlepeer-review

7 Citations (Scopus)

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Engineering & Materials Science

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