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Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces
A. Bilbao-Guillerna, R. T. Eachambadi, G. B.J. Cadot, D. A. Axinte, J. Billingham, F. Stumpf, S. Beuer, M. Rommel
Research output: Journal Publication › Article › peer-review
9
Citations
(Scopus)