Atomic force microscopy for energy research

Cai Shen (Editor)

Research output: Book/ReportBookpeer-review


Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. it has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials - such as lithium-ion batteries, solar cells, and other energy-related materials - are addressed.
Original languageEnglish
Place of PublicationBoca Raton
PublisherCRC Press
Number of pages455
ISBN (Print)9781032004075
Publication statusPublished - 27 Apr 2022


  • Engineering & Technology
  • Physical Sciences


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