Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

Yatai Ji; Paolo Giangrande; Weiduo Zhao; Jing Zhang; Pinjia Zhang

doi:10.1109/TAES.2025.3531842

Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

Yatai Ji, Paolo Giangrande, Weiduo Zhao, Jing Zhang, Pinjia Zhang

Department of Electrical and Electronic Engineering

Research output: Journal Publication › Article › peer-review

Abstract

The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This paper accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage (PDIV) at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.

Original language	English
Journal	IEEE Transactions on Aerospace and Electronic Systems
DOIs	https://doi.org/10.1109/TAES.2025.3531842
Publication status	Accepted/In press - 2025

ASJC Scopus subject areas

Aerospace Engineering
Electrical and Electronic Engineering

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10.1109/TAES.2025.3531842

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@article{56c41541eba242048b76c3fd0b246015,

title = "Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions",

abstract = "The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This paper accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage (PDIV) at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.",

author = "Yatai Ji and Paolo Giangrande and Weiduo Zhao and Jing Zhang and Pinjia Zhang",

note = "Publisher Copyright: {\textcopyright} 1965-2011 IEEE.",

year = "2025",

doi = "10.1109/TAES.2025.3531842",

language = "English",

journal = "IEEE Transactions on Aerospace and Electronic Systems",

issn = "0018-9251",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

AU - Ji, Yatai

AU - Giangrande, Paolo

AU - Zhao, Weiduo

AU - Zhang, Jing

AU - Zhang, Pinjia

PY - 2025

Y1 - 2025

N2 - The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This paper accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage (PDIV) at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.

AB - The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This paper accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage (PDIV) at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.

UR - http://www.scopus.com/inward/record.url?scp=85216118643&partnerID=8YFLogxK

U2 - 10.1109/TAES.2025.3531842

DO - 10.1109/TAES.2025.3531842

M3 - Article

AN - SCOPUS:85216118643

SN - 0018-9251

JO - IEEE Transactions on Aerospace and Electronic Systems

JF - IEEE Transactions on Aerospace and Electronic Systems

ER -

Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

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