Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions

Yatai Ji, Paolo Giangrande, Weiduo Zhao, Jing Zhang, Pinjia Zhang

Research output: Journal PublicationArticlepeer-review

Abstract

The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This article accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.

Original languageEnglish
Pages (from-to)6941-6950
Number of pages10
JournalIEEE Transactions on Aerospace and Electronic Systems
Volume61
Issue number3
DOIs
Publication statusPublished - 2025

ASJC Scopus subject areas

  • Aerospace Engineering
  • Electrical and Electronic Engineering

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