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20212023

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  • Automated metamorphic-relation generation with ChatGPT: an experience report

    Zhang, Y., Towey, D. & Pike, M., 2023, Proceedings - 2023 IEEE 47th Annual Computers, Software, and Applications Conference, COMPSAC 2023. Shahriar, H., Teranishi, Y., Cuzzocrea, A., Sharmin, M., Towey, D., Majumder, A. J. A., Kashiwazaki, H., Yang, J.-J., Takemoto, M., Sakib, N., Banno, R. & Ahamed, S. I. (eds.). IEEE Computer Society, p. 1780-1785 6 p. (Proceedings - International Computer Software and Applications Conference; vol. 2023-June).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)
  • Metamorphic testing harness for the Baidu Apollo perception-camera module

    Zhang, Y., Towey, D., Pike, M., Han, J. C., Zhou, G., Yin, C., Wang, Q. & Xie, C., 2023, Proceedings - 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing, MET 2023. Institute of Electrical and Electronics Engineers Inc., p. 9-16 8 p. (Proceedings - 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing, MET 2023).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

  • Metamorphic testing of an automated parking system: an experience report

    Towey, D., Luo, Z., Zheng, Z., Zhou, P., Yang, J., Ingkasit, P., Lao, C., Pike, M. & Zhang, Y., 2023, Proceedings - 2023 IEEE 47th Annual Computers, Software, and Applications Conference, COMPSAC 2023. Shahriar, H., Teranishi, Y., Cuzzocrea, A., Sharmin, M., Towey, D., Majumder, A. J. A., Kashiwazaki, H., Yang, J.-J., Takemoto, M., Sakib, N., Banno, R. & Ahamed, S. I. (eds.). IEEE Computer Society, p. 1774-1779 6 p. (Proceedings - International Computer Software and Applications Conference; vol. 2023-June).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

  • Preparing Future SQA Professionals: An Experience Report of Metamorphic Exploration of an Autonomous Driving System

    Zhang, Y., Pike, M., Towey, D., Han, J. C. & Zhou, Z. Q., 2022, Proceedings of the 2022 IEEE Global Engineering Education Conference, EDUCON 2022. Jemni, M., Kallel, I. & Akkari, A. (eds.). IEEE Computer Society, p. 2121-2126 6 p. (IEEE Global Engineering Education Conference, EDUCON; vol. 2022-March).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)
  • MT4NS: Metamorphic Testing for Network Scanning

    Zhang, Z., Towey, D., Ying, Z., Zhang, Y. & Zhou, Z. Q., Jun 2021, Proceedings - 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing, MET 2021. Institute of Electrical and Electronics Engineers Inc., p. 17-23 7 p. 9477667. (Proceedings - 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing, MET 2021).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    11 Citations (Scopus)