Filter
Conference contribution

Search results

  • 2025

    Deep Learning-Based Road Defect Detection Using an Improved YOLOv8 Model

    Liu, K., Zheng, H. & He, X., 2025, International Workshop on Advanced Imaging Technology, IWAIT 2025. Nakajima, M., Chang, C.-Y., Yeh, C.-H., Kim, J.-G., Qian, K. & Lau, P. Y. (eds.). SPIE, 135100Q. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 13510).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

  • 2024

    Deep Learning for Retina Structural Biomarker Classification Using OCT Images

    Xu, C., Zheng, H., Liu, K., Chen, Y., Ye, C., Niu, C., Jin, S., Li, Y., Gao, H., Hu, J., Zou, Y. & He, X., 2024, International Workshop on Advanced Imaging Technology, IWAIT 2024. Nakajima, M., Lau, P. Y., Kim, J.-G., Kubo, H., Chang, C.-Y. & Kemao, Q. (eds.). SPIE, 131643C. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 13164).

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review