The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used, for the first time, for the characterization of opaque ancient glasses. Isotope-specific chemical imaging with sub-micron resolution enabled the separate analysis of opacifiying inclusions and the surrounding glass matrix. Phase identification has been demonstrated and quantification of the matrix composition has been investigated by use of Corning Glass Standard B as a model. Trace element detection limits are typically in the range 0.5-5.0 ppm atomic-in favourable cases down to 0.01 ppm. For the analysis of inclusions in particular, this has the potential to provide new information of use in establishing provenance and trade routes by 'fingerprinting' as well as the investigation of manufacturing techniques, as demonstrated by comparisons between glasses and with EDX data from the same samples.