Identification of plasmonic absorption profile in surface plasmon microscopy using morphology

Bei Zhang; Chengqian Zhang; Qiusheng Wang; Peng Yan; Jing Wang

doi:10.1109/JPHOT.2018.2875019

Identification of plasmonic absorption profile in surface plasmon microscopy using morphology

Bei Zhang, Chengqian Zhang, Qiusheng Wang, Peng Yan, Jing Wang

Department of Electrical and Electronic Engineering

Research output: Journal Publication › Article › peer-review

5 Citations (Scopus)

37 Downloads (Pure)

Abstract

Surface plasmon microscopy (SPM) provides the capability of measuring surface properties of subnanometer layers within the diffraction limited order. In a typical SPM, small changes correspond to surface plasmons (SPs) absorption profile variations on a reflecting back focal plane (BFP), which can be monitored in real-time. However, the lack of fast and high-accurate identification method on SPs profiles has posed significant challenges on objective-coupled SPM instruments, and also limited their practical applications in fast phenomenon sensing and image batch processing. Here we propose a morphological method to identify the SPs absorption profiles. It can extract the SPs profile information from experimentally recorded BFP images with low quality properly and automatically. Experimental verification and further discussions are included.

Original language	English
Article number	8486642
Journal	IEEE Photonics Journal
Volume	10
Issue number	6
DOIs	https://doi.org/10.1109/JPHOT.2018.2875019
Publication status	Published - Dec 2018

Keywords

Surface plasmon microscopy
identification
image processing
morphology

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1109/JPHOT.2018.2875019

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title = "Identification of plasmonic absorption profile in surface plasmon microscopy using morphology",

abstract = "Surface plasmon microscopy (SPM) provides the capability of measuring surface properties of subnanometer layers within the diffraction limited order. In a typical SPM, small changes correspond to surface plasmons (SPs) absorption profile variations on a reflecting back focal plane (BFP), which can be monitored in real-time. However, the lack of fast and high-accurate identification method on SPs profiles has posed significant challenges on objective-coupled SPM instruments, and also limited their practical applications in fast phenomenon sensing and image batch processing. Here we propose a morphological method to identify the SPs absorption profiles. It can extract the SPs profile information from experimentally recorded BFP images with low quality properly and automatically. Experimental verification and further discussions are included.",

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author = "Bei Zhang and Chengqian Zhang and Qiusheng Wang and Peng Yan and Jing Wang",

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year = "2018",

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AU - Zhang, Bei

AU - Zhang, Chengqian

AU - Wang, Qiusheng

AU - Yan, Peng

AU - Wang, Jing

PY - 2018/12

Y1 - 2018/12

N2 - Surface plasmon microscopy (SPM) provides the capability of measuring surface properties of subnanometer layers within the diffraction limited order. In a typical SPM, small changes correspond to surface plasmons (SPs) absorption profile variations on a reflecting back focal plane (BFP), which can be monitored in real-time. However, the lack of fast and high-accurate identification method on SPs profiles has posed significant challenges on objective-coupled SPM instruments, and also limited their practical applications in fast phenomenon sensing and image batch processing. Here we propose a morphological method to identify the SPs absorption profiles. It can extract the SPs profile information from experimentally recorded BFP images with low quality properly and automatically. Experimental verification and further discussions are included.

AB - Surface plasmon microscopy (SPM) provides the capability of measuring surface properties of subnanometer layers within the diffraction limited order. In a typical SPM, small changes correspond to surface plasmons (SPs) absorption profile variations on a reflecting back focal plane (BFP), which can be monitored in real-time. However, the lack of fast and high-accurate identification method on SPs profiles has posed significant challenges on objective-coupled SPM instruments, and also limited their practical applications in fast phenomenon sensing and image batch processing. Here we propose a morphological method to identify the SPs absorption profiles. It can extract the SPs profile information from experimentally recorded BFP images with low quality properly and automatically. Experimental verification and further discussions are included.

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KW - identification

KW - image processing

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Identification of plasmonic absorption profile in surface plasmon microscopy using morphology

Abstract

Keywords

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