@inproceedings{27252f36a3814b6dbb9a38e8627e3002,
title = "Determination of electrical aging test voltage level under a low-pressure environment for accurate lifetime prediction",
abstract = "Rapid growth of electric stress boosts the partial discharge (PD) risk of insulation and leads to electrical aging. For transportation applications (i.e., safety-critical), reliability is top-priority which means the lifetime of electrical machines (EMs) should be accurately estimated. Electrical aging of Type II insulated EMs caused by PD activity is greatly affected by ambient pressure. During accelerated aging tests, an improper test voltage selection might result in misleading lifetime estimation. In this paper, the allowable voltage levels are accurately determined by relying on aging tests under six different voltage levels at 600mbar, which gives a useful guideline for insulation design and the reliability of EMs could be accurately assessed.",
keywords = "electrical aging, electrical machines, partial discharge, pressure, reliability",
author = "Yatai Ji and Paolo Giangrande and Weiduo Zhao and Vincenzo Madonna and He Zhang and Michael Galea",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 26th International Conference on Electrical Machines and Systems, ICEMS 2023 ; Conference date: 05-11-2023 Through 08-11-2023",
year = "2023",
doi = "10.1109/ICEMS59686.2023.10344439",
language = "English",
series = "2023 26th International Conference on Electrical Machines and Systems, ICEMS 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "550--554",
booktitle = "2023 26th International Conference on Electrical Machines and Systems, ICEMS 2023",
address = "United States",
}