TY - JOUR
T1 - Correction to
T2 - Deposition of bismuth sulfide and aluminum doped bismuth sulfide thin films for photovoltaic applications (Journal of Materials Science: Materials in Electronics, (2022), 33, 1, (42-53), 10.1007/s10854-021-07154-0)
AU - Fazal, Tanzeela
AU - Iqbal, Shahid
AU - Shah, Mazloom
AU - Bahadur, Ali
AU - Ismail, Bushra
AU - Abd-Rabboh, Hisham S.M.
AU - Hameed, Rabia
AU - Mahmood, Qaiser
AU - Ibrar, Aliya
AU - Nasar, Muhammad Sufyan
AU - Ehsan, Yasir
AU - Saqib, Ahmad Nauman Shah
AU - Adnan,
AU - Qayyum, Muhammad Abdul
N1 - Publisher Copyright:
© Springer Science+Business Media, LLC, part of Springer Nature 2021.
PY - 2022/1
Y1 - 2022/1
N2 - The original version of the article was published with errors in the name and affiliation of Dr. Ahmad Nauman Shah Saqib. The following corrections have been made 1. The author’s name incorrectly written as ‘‘Ahamd Nauma’’ is changed to ‘‘Ahmad Nauman Shah Saqib’’. 2. Affiliation of Dr. Ahmad Nauman Shah Saqib incorrectly written as ‘‘Department of Chemistry, Education University-Attock Campus (EU) Attock, Sargodha, Pakistan’’ is changed to ‘‘Department of Chemistry, University of Education Lahore, Attock campus, Attock-43600, Pakistan’’. The original article has been corrected.
AB - The original version of the article was published with errors in the name and affiliation of Dr. Ahmad Nauman Shah Saqib. The following corrections have been made 1. The author’s name incorrectly written as ‘‘Ahamd Nauma’’ is changed to ‘‘Ahmad Nauman Shah Saqib’’. 2. Affiliation of Dr. Ahmad Nauman Shah Saqib incorrectly written as ‘‘Department of Chemistry, Education University-Attock Campus (EU) Attock, Sargodha, Pakistan’’ is changed to ‘‘Department of Chemistry, University of Education Lahore, Attock campus, Attock-43600, Pakistan’’. The original article has been corrected.
UR - http://www.scopus.com/inward/record.url?scp=85119171248&partnerID=8YFLogxK
U2 - 10.1007/s10854-021-07329-9
DO - 10.1007/s10854-021-07329-9
M3 - Comment/debate
AN - SCOPUS:85119171248
SN - 0957-4522
VL - 33
SP - 54
EP - 55
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 1
ER -