Abstract
Silicon suboxides play an important role in different industrial applications, particularly in the form of the Si-SiO2 interface, which is one of the key elements in present day microelectronics and potentially in future nano-electronics as well. This paper focuses on the chemical and mechanical effects related to the existence of different oxidation states of Si atoms in SiO x systems with various Si:O composition and topology, such as O atoms in Si, the Si-SiO2 interface, and O vacancies in SiO2. We compare the stress-strain relation in SiO 2 interfaces with (100), (111) and (110) surfaces, the relative stability of oxygen vacancies at different locations in Si-SiO2 layers and defects in Si and SiO2 crystals related to O migration. Our study is based on ab initio computations of molecular and periodic systems with both localized and plane wave basis sets.
Original language | English |
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Pages (from-to) | 185-200 |
Number of pages | 16 |
Journal | Journal of Computer-Aided Materials Design |
Volume | 13 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - Oct 2006 |
Externally published | Yes |
Keywords
- Chemical and mechanical stress
- Density functional theory
- Periodic systems
- SiO interfaces
- Silicon suboxides
ASJC Scopus subject areas
- General Materials Science
- Computer Science Applications
- Computational Theory and Mathematics