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Atomic scale model interfaces between high- k hafnium silicates and silicon
S. Monaghan,
J. C. Greer
, S. D. Elliott
Research output
:
Journal Publication
›
Article
›
peer-review
27
Citations (Scopus)
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Engineering & Materials Science
Hafnium
100%
Silicates
72%
Silicon
49%
Density functional theory
47%
Gate dielectrics
44%
Defects
43%
Oxide semiconductors
37%
Molecular dynamics
35%
Solubility
34%
Field effect transistors
33%
Thermodynamic stability
32%
Permittivity
31%
Oxidation
27%
Oxygen
25%
Substrates
22%
Metals
20%
Geometry
19%
Physics & Astronomy
hafnium
78%
scale models
72%
silicates
61%
silicon
33%
defects
14%
solubility
11%
CMOS
11%
thermal stability
11%
field effect transistors
9%
density functional theory
9%
oxidation
9%
molecular dynamics
9%
permittivity
8%
optimization
8%
oxygen
7%
geometry
7%
Chemical Compounds
Hafnium Atom
75%
Permittivity
35%
Molecular Geometry
34%
Field Effect
31%
Dielectric Material
27%
Molecular Dynamics
23%
Thermal Stability
20%
Solubility
19%
Density Functional Theory
19%
Oxidation Reaction
14%
Surface
10%