Abstract
Cluster and band structure calculations for the electronic energy levels of silicon-germanium systems are presented. Much of the electronic structure information concerning silicon-germanium alloys to date relies upon the virtual crystal approximation (VGA). A discussion is presented for corrections beyond the VGA and in particular the use of full band calculations for device modeling of SiGe technologies.
Original language | English |
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Pages (from-to) | 109-114 |
Number of pages | 6 |
Journal | Materials Science in Semiconductor Processing |
Volume | 3 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - Mar 2000 |
Externally published | Yes |
Event | 1999 E-MRS Spring Meeting Symposium L: Ab Inito Approches to Microelectronics Materials and Process Modelling - Strasbourg, France Duration: 1 Jun 1999 → 4 Jun 1999 |
Keywords
- Band structure
- Device modeling
- Electron scattering
- Silicon-germanium
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering