A Max-Relevance-Min-Divergence criterion for data discretization with applications on naive Bayes

Shihe Wang, Jianfeng Ren, Ruibin Bai, Yuan Yao, Xudong Jiang

Research output: Journal PublicationArticlepeer-review

Fingerprint

Dive into the research topics of 'A Max-Relevance-Min-Divergence criterion for data discretization with applications on naive Bayes'. Together they form a unique fingerprint.

Engineering & Materials Science