Using the information: Incorporating positive feedback information into the testing process

Kwok Ping Chan, D. Towey, Tsong Yueh Chen, Fei Ching Kuo, R. Merkel

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Software testing is recognized as an essential part of the software development process. Random testing (RT), the selection of input test cases at random from the input domain, is a simple and efficient method of software testing. RT does not however make use of previously executed test case information; in particular, information about nonfailure-causing test cases is ignored. Intuitively, use of this positive feedback information can improve the failure-finding efficiency of a testing method. Adaptive random testing (ART) makes use of knowledge of general failure pattern types, and information of previously executed test cases, in the selection of new test cases. A failure pattern in a program's input domain is composed of the regions of failure-causing inputs. Previous research has categorized failure patterns broadly into three types: point; strip; and block, and has identified important implications for the failure-finding efficiency of test methods, depending on the failure pattern type. In particular, it has been found that for nonpoint type patterns, the efficiency of RT can be improved upon by simple modification of the basic approach: by ensuring a more even and widespread distribution of test cases over the input domain, the number of test cases required to find the first failure (F-measure) can be reduced dramatically. This insight has motivated several adaptive random testing methods, and produced convincing results. This paper introduces some of the research in this area and suggests areas of interest for future work.

Original languageEnglish
Title of host publicationProceedings - 11th Annual International Workshop on Software Technology and Engineering Practice, STEP 2003
EditorsLiam O'Brien, Nicolas Gold, Kostas Kontogiannis
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages71-76
Number of pages6
ISBN (Electronic)0769522181, 9780769522180
DOIs
Publication statusPublished - 2004
Externally publishedYes
Event11th Annual International Workshop on Software Technology and Engineering Practice, STEP 2003 - Amsterdam, Netherlands
Duration: 19 Sep 200321 Sep 2003

Publication series

NameProceedings - 11th Annual International Workshop on Software Technology and Engineering Practice, STEP 2003

Conference

Conference11th Annual International Workshop on Software Technology and Engineering Practice, STEP 2003
Country/TerritoryNetherlands
CityAmsterdam
Period19/09/0321/09/03

Keywords

  • Computer science
  • Feedback
  • Information systems
  • Information technology
  • Programming
  • Software engineering
  • Software testing
  • Strips
  • Subspace constraints
  • System testing

ASJC Scopus subject areas

  • Software

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