The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses

Keyphrases

• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 100%
• Ancient Glass 100%
• Manufacturing Methods 50%
• Limit of Detection 50%
• Fingerprinting 50%
• Trade Routes 50%
• Phase Detection 50%
• Matrix Composition 50%
• Submicron Resolution 50%
• Separation Analysis 50%
• Glass Matrix 50%
• Chemical Imaging 50%
• Trace Element Detection 50%
• Corning Glass 50%

Chemistry

• Time-of-Flight Secondary Ion Mass Spectrometry 100%
• Phase Composition 50%
• Energy-Dispersive X-Ray Spectroscopy 50%
• Imaging in Chemistry 50%