TY - GEN
T1 - Simplified intelligence single particle optimization based neural network for digit recognition
AU - Zhou, Jiarui
AU - Ji, Zhen
AU - Shen, Linlin
PY - 2008
Y1 - 2008
N2 - To overcome the drawback of overly dependence on the input parameters in intelligence single particle optimization (ISPO), an improved algorithm, called simplified intelligence single particle optimization (SISPO), is proposed in this paper. While maintaining similar performance as ISPO, no special parameter settings are required by SISPO. The proposed SISPO was successfully applied to train neural network classifier for digit recognition. Experimental results demonstrated that, the proposed neural network training algorithm, Simplified Intelligence Single Particle Optimization Neural Network (SISPONN), achieved less training error and test error than traditional BP algorithms like gradient methods.
AB - To overcome the drawback of overly dependence on the input parameters in intelligence single particle optimization (ISPO), an improved algorithm, called simplified intelligence single particle optimization (SISPO), is proposed in this paper. While maintaining similar performance as ISPO, no special parameter settings are required by SISPO. The proposed SISPO was successfully applied to train neural network classifier for digit recognition. Experimental results demonstrated that, the proposed neural network training algorithm, Simplified Intelligence Single Particle Optimization Neural Network (SISPONN), achieved less training error and test error than traditional BP algorithms like gradient methods.
KW - Digital recognition
KW - ISPO
KW - Intelligence single particle optimization
KW - Neural network
UR - http://www.scopus.com/inward/record.url?scp=57949098192&partnerID=8YFLogxK
U2 - 10.1109/CCPR.2008.74
DO - 10.1109/CCPR.2008.74
M3 - Conference contribution
AN - SCOPUS:57949098192
SN - 9781424423163
T3 - Proceedings of the 2008 Chinese Conference on Pattern Recognition, CCPR 2008
SP - 349
EP - 353
BT - Proceedings of the 2008 Chinese Conference on Pattern Recognition, CCPR 2008
T2 - 2008 Chinese Conference on Pattern Recognition, CCPR 2008
Y2 - 22 October 2008 through 24 October 2008
ER -