@inproceedings{eb4c93e95a9c48a69a0e21d463a41293,
title = "Set-based direct visual servoing for nanopositioning",
abstract = "Atomic force microscopy (AFM) can be used as an image tool in nanoscale for nanopositioning and other similar works. This problem can be seen as a visual servoing problem. Traditional works for this problem use position-based algorithms, however, the correspondence problem is needed to be solved by feature matching and tracking firstly, as a prerequisite for vision-based control. The correspondence problem refers to the problem of ascertaining which parts of one image correspond to which parts of another image. To solve the problem of AFM based nanomanipulations, we present a novel set-based direct visual servoing controller (SDVSC) for nanopositioning that is based on the whole gray image and does not require feature matching and tracking.",
keywords = "Atomic force microscopy, mutational analysis for shapes, Nanopositionging, space of sets, visual servoing",
author = "Zhichao Liu and Jianliang Wang and Poh, {Eng Kee}",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 23rd Mediterranean Conference on Control and Automation, MED 2015 ; Conference date: 16-06-2015 Through 19-06-2015",
year = "2015",
month = jul,
day = "14",
doi = "10.1109/MED.2015.7158839",
language = "English",
series = "2015 23rd Mediterranean Conference on Control and Automation, MED 2015 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "772--776",
editor = "Victor Munoz and Joseba Quevedo and Martinez, {Jorge L.} and Jesus Morales",
booktitle = "2015 23rd Mediterranean Conference on Control and Automation, MED 2015 - Conference Proceedings",
address = "United States",
}