Measurement of inter-particle forces by an interfacial force microscope

Qing Huang; Asghar Mesbah-Nejad; Seyed M. Tadayyon; Peter Norton; Hui Zhang; Jesse Zhu

doi:10.1016/j.partic.2010.05.011

Measurement of inter-particle forces by an interfacial force microscope

Qing Huang, Asghar Mesbah-Nejad, Seyed M. Tadayyon, Peter Norton, Hui Zhang, Jesse Zhu

Research output: Journal Publication › Article › peer-review

10 Citations (Scopus)

Abstract

An interfacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

Original language	English
Pages (from-to)	400-406
Number of pages	7
Journal	Particuology
Volume	8
Issue number	5
DOIs	https://doi.org/10.1016/j.partic.2010.05.011
Publication status	Published - Oct 2010
Externally published	Yes

Keywords

Fine powder
Inter-particle forces
Interfacial force microscope
van der Waals force

ASJC Scopus subject areas

General Chemical Engineering
General Materials Science

Access to Document

10.1016/j.partic.2010.05.011

Cite this

@article{2899ed23bd2340c2912948066418a19c,

title = "Measurement of inter-particle forces by an interfacial force microscope",

abstract = "An interfacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.",

keywords = "Fine powder, Inter-particle forces, Interfacial force microscope, van der Waals force",

author = "Qing Huang and Asghar Mesbah-Nejad and Tadayyon, {Seyed M.} and Peter Norton and Hui Zhang and Jesse Zhu",

year = "2010",

month = oct,

doi = "10.1016/j.partic.2010.05.011",

language = "English",

volume = "8",

pages = "400--406",

journal = "Particuology",

issn = "1674-2001",

publisher = "Elsevier B.V.",

number = "5",

}

TY - JOUR

T1 - Measurement of inter-particle forces by an interfacial force microscope

AU - Huang, Qing

AU - Mesbah-Nejad, Asghar

AU - Tadayyon, Seyed M.

AU - Norton, Peter

AU - Zhang, Hui

AU - Zhu, Jesse

PY - 2010/10

Y1 - 2010/10

N2 - An interfacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

AB - An interfacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

KW - Fine powder

KW - Inter-particle forces

KW - Interfacial force microscope

KW - van der Waals force

UR - http://www.scopus.com/inward/record.url?scp=77957948394&partnerID=8YFLogxK

U2 - 10.1016/j.partic.2010.05.011

DO - 10.1016/j.partic.2010.05.011

M3 - Article

AN - SCOPUS:77957948394

SN - 1674-2001

VL - 8

SP - 400

EP - 406

JO - Particuology

JF - Particuology

IS - 5

ER -

Measurement of inter-particle forces by an interfacial force microscope

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this