Image segmentation of overlapping particles in automatic size analysis using multi-flash imaging

Tze Ki Koh, Nicholas Miles, Steve Morgan, Barrie Hayes-Gill

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    9 Citations (Scopus)

    Abstract

    In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on Multi-Flash Imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles.

    Original languageEnglish
    Title of host publicationProceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007
    DOIs
    Publication statusPublished - 2007
    Event7th IEEE Workshop on Applications of Computer Vision, WACV 2007 - Austin, TX, United States
    Duration: 21 Feb 200722 Feb 2007

    Publication series

    NameProceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007

    Conference

    Conference7th IEEE Workshop on Applications of Computer Vision, WACV 2007
    Country/TerritoryUnited States
    CityAustin, TX
    Period21/02/0722/02/07

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Software

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