TY - GEN
T1 - Image segmentation of overlapping particles in automatic size analysis using multi-flash imaging
AU - Koh, Tze Ki
AU - Miles, Nicholas
AU - Morgan, Steve
AU - Hayes-Gill, Barrie
PY - 2007
Y1 - 2007
N2 - In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on Multi-Flash Imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles.
AB - In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on Multi-Flash Imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles.
UR - http://www.scopus.com/inward/record.url?scp=34547186480&partnerID=8YFLogxK
U2 - 10.1109/WACV.2007.37
DO - 10.1109/WACV.2007.37
M3 - Conference contribution
AN - SCOPUS:34547186480
SN - 0769527949
SN - 9780769527949
T3 - Proceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007
BT - Proceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007
T2 - 7th IEEE Workshop on Applications of Computer Vision, WACV 2007
Y2 - 21 February 2007 through 22 February 2007
ER -