High-speed all-in-focus 3D imaging technology based on the liquid lens focus scanning

Huayu Cheng, Lihui Wang, Satoshi Tabata, Yuan He, Yan Hu, Jiang Liu

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review


A large open aperture in an optical system can capture high-resolution images but yields a shallow depth of field. To overcome this issue, we propose a method for improving microscopy imaging systems by using a variable-focus liquid lens to achieve 3D focus scanning. Specifically, the focal length of the imaging system was changed by the liquid lens, and a sequence of 12 images was captured in different focal planes. The image scale was adjusted according to the change in focal length, and the phase of the image was corrected by the phase only correction method. Then the in-focus pixels were abstracted by employing the Laplacian operator. Finally, an all-in-focus sharp image was generated, and a depth map was obtained. Additionally, to accelerate the processing speed, the Fast Fourier Transform image processing during phase correction was optimized. Meanwhile, we propose a parallel optimization solution for the original processing flow.

Original languageEnglish
Title of host publicationOptoelectronic Imaging and Multimedia Technology X
EditorsQionghai Dai, Tsutomu Shimura, Zhenrong Zheng
ISBN (Electronic)9781510667839
Publication statusPublished - 2023
Externally publishedYes
EventOptoelectronic Imaging and Multimedia Technology X 2023 - Beijing, China
Duration: 15 Oct 202316 Oct 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceOptoelectronic Imaging and Multimedia Technology X 2023


  • 3D Focus scanning
  • all-in-focus image
  • depth map
  • focus scanning
  • focus stacking
  • Variable-focus lens

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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