Electron transport properties of sub-3-nm diameter copper nanowires

Sarah L.T. Jones, Alfonso Sanchez-Soares, John J. Plombon, Ananth P. Kaushik, Roger E. Nagle, James S. Clarke, James C. Greer

Research output: Journal PublicationArticlepeer-review

26 Citations (Scopus)

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Engineering & Materials Science

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