An improved estimation of size distribution from particle profile measurements

S. Al-Thyabat, N. J. Miles

    Research output: Journal PublicationArticlepeer-review

    70 Citations (Scopus)

    Abstract

    Several methods are available to measure particle size. The majority of them, such as sieving, are off-stream techniques where samples must first be separated from the main stream for analysis. Therefore, the search for on-line particle size analysis systems has provided the impetus for the introduction of image-based particle size analysers to the mineral industry in the past three decades. Generally, the estimation of particle size distribution on the basis of image analysis depends on measuring a single parameter of particle profile. For example the equivalent area diameter (dA) or mean Feret's diameter (dF) distributions, then transforming this data to the equivalent size distribution. However, due to the irregularity of particles being analysed, it is believed that this kind of analysis may increase the error in estimation of particle size distribution since profiles of irregular particles carry more information than can be represented by a single parameter. In this paper, a proposed technique which measures two parameters, equivalent area diameter (dA) and mean Feret's diameter (dF), for each particle profile has been developed. The accuracy of the technique has then been investigated in the laboratory by successfully estimating (unfolding) the size distribution, where size refers to sieve size, of three samples of different particle shapes with known size distribution.

    Original languageEnglish
    Pages (from-to)152-160
    Number of pages9
    JournalPowder Technology
    Volume166
    Issue number3
    DOIs
    Publication statusPublished - 28 Aug 2006

    Keywords

    • Image analysis
    • Particle shape
    • Particle size distribution

    ASJC Scopus subject areas

    • General Chemical Engineering

    Fingerprint

    Dive into the research topics of 'An improved estimation of size distribution from particle profile measurements'. Together they form a unique fingerprint.

    Cite this