Zhang, Z.,
Towey, D.,
Ying, Z.,
Zhang, Y. &
Zhou, Z. Q.,
Jun 2021,
Proceedings - 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing, MET 2021. Institute of Electrical and Electronics Engineers Inc.,
p. 17-23 7 p. 9477667. (Proceedings - 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing, MET 2021).
Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review