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SetupKit: Efficient Multi-Corner Setup/Hold Time Characterization Using Bias-Enhanced Interpolation and Active Learning

  • Junzhuo Zhou
  • , Ziwen Wang
  • , Haoxuan Xia
  • , Yuxin Yan
  • , Chengyu Zhu
  • , Ting Jung Lin
  • , Wei Xing
  • , Lei He

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

Accurate setup/hold time characterization is crucial for modern chip timing closure, but its reliance on potentially millions of SPICE simulations across diverse process-voltage-temperature (PVT) corners creates a major bottleneck, often lasting weeks or months. Existing methods suffer from slow search convergence and inefficient exploration, especially in the multi-corner setting. We introduce SetupKit, a novel framework designed to break this bottleneck using statistical intelligence, circuit analysis and active learning (AL). SetupKit integrates three key innovations: BEIRA, a bias-enhanced interpolation search derived from statistical error modeling to accelerate convergence by overcoming stagnation issues, initial search interval estimation by circuit analysis and AL strategy using Gaussian Process. This AL component intelligently learns PVT-timing correlations, actively guiding the expensive simulations to the most informative corners, thus minimizing redundancy in multi-corner characterization. Evaluated on industrial 22nm standard cells across 16 PVT corners, SetupKit demonstrates a significant 2.4× overall CPU time reduction (from 720 to 290 days on a single core) compared to standard practices, drastically cutting characterization time. SetupKit offers a principled, learning-based approach to library characterization, addressing a critical EDA challenge and paving the way for more intelligent simulation management.

Original languageEnglish
Title of host publication2025 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331515607
DOIs
Publication statusPublished - 2025
Externally publishedYes
Event44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Munich, Germany
Duration: 26 Oct 202530 Oct 2025

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025
Country/TerritoryGermany
CityMunich
Period26/10/2530/10/25

Free Keywords

  • Active Learning
  • Bisection
  • Brent's Method
  • PVT-Corner
  • Setup/Hold Time
  • Standard Cell Characterization

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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