@inproceedings{129e918711a64c67bf7e5a71526a9efb,
title = "SetupKit: Efficient Multi-Corner Setup/Hold Time Characterization Using Bias-Enhanced Interpolation and Active Learning",
abstract = "Accurate setup/hold time characterization is crucial for modern chip timing closure, but its reliance on potentially millions of SPICE simulations across diverse process-voltage-temperature (PVT) corners creates a major bottleneck, often lasting weeks or months. Existing methods suffer from slow search convergence and inefficient exploration, especially in the multi-corner setting. We introduce SetupKit, a novel framework designed to break this bottleneck using statistical intelligence, circuit analysis and active learning (AL). SetupKit integrates three key innovations: BEIRA, a bias-enhanced interpolation search derived from statistical error modeling to accelerate convergence by overcoming stagnation issues, initial search interval estimation by circuit analysis and AL strategy using Gaussian Process. This AL component intelligently learns PVT-timing correlations, actively guiding the expensive simulations to the most informative corners, thus minimizing redundancy in multi-corner characterization. Evaluated on industrial 22nm standard cells across 16 PVT corners, SetupKit demonstrates a significant 2.4× overall CPU time reduction (from 720 to 290 days on a single core) compared to standard practices, drastically cutting characterization time. SetupKit offers a principled, learning-based approach to library characterization, addressing a critical EDA challenge and paving the way for more intelligent simulation management.",
keywords = "Active Learning, Bisection, Brent's Method, PVT-Corner, Setup/Hold Time, Standard Cell Characterization",
author = "Junzhuo Zhou and Ziwen Wang and Haoxuan Xia and Yuxin Yan and Chengyu Zhu and Lin, \{Ting Jung\} and Wei Xing and Lei He",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 ; Conference date: 26-10-2025 Through 30-10-2025",
year = "2025",
doi = "10.1109/ICCAD66269.2025.11240969",
language = "English",
series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2025 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Conference Proceedings",
address = "United States",
}