Abstract
Employing backscatter communication is a promising solution for Internet of Things (IoT). The novel large intelligent surface (LIS) concept can achieve reliable communication by establishing line-of-sight like channels. This letter thus considers an LIS-aided backscatter system to support high-reliable communications for IoT applications. In this letter, the symbol error probability (SEP) for both intelligent and random phase adjustments at the LIS reflectors is analytically investigated. In particular, we calculate the SEP based on the moment generating function approach and also provide tight SEP upper bounds for either fully correlated or mutually independent channels. Insightful observations of SEP outcomes reveal that having a large number of reflective elements on the LIS has a significantly positive impact on the SEP performance where high reliability can be achieved in moderate signal-to-noise.
| Original language | English |
|---|---|
| Article number | 9017956 |
| Pages (from-to) | 962-966 |
| Number of pages | 5 |
| Journal | IEEE Wireless Communications Letters |
| Volume | 9 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2020 |
| Externally published | Yes |
Keywords
- Backscatter communication
- high-reliable communication
- Internet of Things (IoT)
- large intelligent surface
- symbol error probability
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering