Mitigating Perovskite Light-Emitting Diode Degradation Mechanisms through Forward Electrical Pulses

Keyphrases

• Degradation Mechanism 100%
• Perovskite Light-emitting Diodes (PeLEDs) 100%
• Electrical Pulse 100%
• Capacitance-voltage 100%
• External Quantum Efficiency 75%
• Quantum Dot Light-emitting Diodes 75%
• Perovskite Quantum Dots 75%
• Charge Dynamics 75%
• Buffer Layer 50%
• Voltage Model 50%
• CsPbI3 Quantum Dots 50%
• Charge Balance 25%
• Quantum Dots 25%
• Dynamic Characteristics 25%
• Dynamic Process 25%
• Characteristic Curve 25%
• Complex Interactions 25%
• Radiative Recombination 25%
• Stable Operation 25%
• Dark Current 25%
• Rapid Decay 25%
• Lifetime Test 25%
• Accumulation Area 25%
• Recombination Region 25%
• Charge Accumulation 25%
• Nyquist Plot 25%
• Quantum Stability 25%
• Low Injection 25%
• Electron Injection 25%
• Voltage Modeling 25%
• Carrier Injection 25%
• LUMO Level 25%

Engineering

• Light-Emitting Diode 100%
• Degradation Mechanism 100%
• Quantum Dot 75%
• External Quantum Efficiency 75%
• Perovskite Quantum Dot 75%
• Defects 50%
• Buffer Layer 50%
• Shallower 25%
• Radiative Recombination 25%
• Characteristic Curve 25%
• Dynamic Process 25%
• Nyquist Plot 25%
• Electron Injection 25%

Material Science

• Light-Emitting Diode 100%
• Capacitance 100%
• Quantum Dot 75%
• Perovskite Quantum Dot 75%
• Buffer Layer 50%