Image segmentation of overlapping particles in automatic size analysis using multi-flash imaging

Tze Ki Koh, Nicholas Miles, Steve Morgan, Barrie Hayes-Gill

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

8 Citations (Scopus)

Abstract

In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on Multi-Flash Imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles.

Original languageEnglish
Title of host publicationProceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event7th IEEE Workshop on Applications of Computer Vision, WACV 2007 - Austin, TX, United States
Duration: 21 Feb 200722 Feb 2007

Publication series

NameProceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007

Conference

Conference7th IEEE Workshop on Applications of Computer Vision, WACV 2007
Country/TerritoryUnited States
CityAustin, TX
Period21/02/0722/02/07

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Software

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