Abstract
High-performance transparent and low-process-temperature p-type devices are essential for portable and ‘invisible’ electronics. In this work, high-performance p-channel copper iodide (CuI) thin-film transistors (TFTs) with a bottom-gate structure are achieved via replacing traditional SiO2 dielectric with Chitosan (CS, a kind of solid polymer electrolytes), with the threshold voltage down to −0.35 V, field-effect mobility (μFE) up to 60 cm2V−1s−1 and on/off current ratio (Ion/Ioff) beyond 103. The CuI films spin-coated on CS-dielectrics in the air with high humidity have smoother surface morphology, tinier grains, higher packing density and hence a higher μFE, in sharp contrast with the SiO2 case. In addition, the CuI films on CS-dielectrics demonstrate a work function ∼ 0.1 eV lower than that on SiO2, which implies a smaller hole concentration and higher Ion/Ioff. And the low process temperature (
| Original language | English |
|---|---|
| Article number | 155795 |
| Journal | Applied Surface Science |
| Volume | 612 |
| DOIs | |
| Publication status | Published - Mar 2023 |
Free Keywords
- Metal (pseudo) halides
- P-type semiconductors
- Thin-film transistors
- Kelvin probe force microscope
- Complementary devices/circuits
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