Fault-Tolerant Performance in Multi-Unit PMSMs Through Slot Geometry and Magnetic Decoupling

  • Yingnan Wang
  • , Chengming Zhang
  • , Yingzhen Liu
  • , David Gerada
  • , Fengyu Zhang
  • , Zeyuan Xu

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

To enhance the fault tolerance of modular multi-unit three-phase PMSMs, this paper investigates the influence of pole-slot combinations and stator slot geometries on inter-phase magnetic coupling. A novel open-slot structure with fault-tolerant teeth (FTT) is proposed to improve magnetic decoupling and unit-level independence.Two configurations - 40p48s and 40p36s - combined with three slot types are analyzed via finite element simulation. Flux distribution and inductance matrices are obtained to quantify magnetic coupling, and a coupling coefficient is defined for comparison.To evaluate short-circuit performance, turn-to-turn faults of varying severity are introduced via an external circuit model. Results show that the 40p36s structure with FTT provides superior decoupling and fault containment, enabling continued operation of healthy units without control intervention.

Original languageEnglish
Title of host publicationIECON 2025 - 51st Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Computer Society
ISBN (Electronic)9798331596811
DOIs
Publication statusPublished - 2025
Event51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025 - Madrid, Spain
Duration: 14 Oct 202517 Oct 2025

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
ISSN (Print)2162-4704
ISSN (Electronic)2577-1647

Conference

Conference51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025
Country/TerritorySpain
CityMadrid
Period14/10/2517/10/25

Free Keywords

  • fault-tolerant teeth
  • magnetic decoupling
  • magnetic field distribution
  • Multi-unit modular PMSM
  • turn-to-turn SC

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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