Abstract
Cluster and band structure calculations for the electronic energy levels of silicon-germanium systems are presented. Much of the electronic structure information concerning silicon-germanium alloys to date relies upon the virtual crystal approximation (VGA). A discussion is presented for corrections beyond the VGA and in particular the use of full band calculations for device modeling of SiGe technologies.
| Original language | English |
|---|---|
| Pages (from-to) | 109-114 |
| Number of pages | 6 |
| Journal | Materials Science in Semiconductor Processing |
| Volume | 3 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - Mar 2000 |
| Externally published | Yes |
| Event | 1999 E-MRS Spring Meeting Symposium L: Ab Inito Approches to Microelectronics Materials and Process Modelling - Strasbourg, France Duration: 1 Jun 1999 → 4 Jun 1999 |
Keywords
- Band structure
- Device modeling
- Electron scattering
- Silicon-germanium
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering