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  • 2005

    Adaptive random testing with filtering: An overhead reduction technique

    Chan, K. P., Chen, T. Y. & Towey, D., 2005, 17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005. p. 292-299 8 p. (17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005).

    Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

    11 Citations (Scopus)